Invited talk at MS&T 23
Professor Sato gave an invited talk on electron microscopy characterization of nanostructure in ferroelectrics and grain boundary in zinc oxide semiconductors at the Fulrath Award symposium in MS&T ’23 meeting.
Professor Sato gave an invited talk on electron microscopy characterization of nanostructure in ferroelectrics and grain boundary in zinc oxide semiconductors at the Fulrath Award symposium in MS&T ’23 meeting.